QTL for flag leaf size and their influence on yield-related traits in wheat

文献类型： 外文期刊

第一作者： Zhao, Chunhua

作者： Zhao, Chunhua;Guan, Chunhui;Cui, Junpeng;Wu, Yongzhen;Sun, Han;Cui, Fa;Bao, Yinguang;Li, Xingfeng;Wang, Honggang;Wang, Xiuqin;Yu, Haitao;Ding, Anming;Zhai, Dongfeng;Li, Linzhi

作者机构：

关键词： Flag leaf-related traits; Yield potential; Quantitative trait loci; QTL clusters

期刊名称：EUPHYTICA （ 影响因子：1.895； 五年影响因子：2.181 ）

ISSN： 0014-2336

年卷期： 2018 年 214 卷 11 期

页码：

收录情况： SCI

摘要： Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield potential in wheat (Triticum aestivum L.). In this study, three related recombinant inbred line (RIL) populations with a common female parent were developed to identify quantitative trait loci (QTL) for flag leaf width (FLW), length (FLL), and area (FLA) in four environments. A total of 31 QTL were detected in four environments. Two QTL for FLL on chromosomes 3B and 4A (QFll-3B and QFll-4A) and one for FLW on chromosome 2A (QFlw-2A) were major stable QTL. Ten QTL clusters (C1-C10) simultaneously controlling FLRTs and yield-related traits (YRTs) were identified. To investigate the genetic relationship between FLRTs and YRTs, correlation analysis was conducted. FLRTs were found to be positively correlated with YRTs especially with kernel weight per spike and kernel number per spike in all the three RIL populations and negatively correlated with spike number per plant. Appropriate flag leaf size could benefit the formation of high yield potential. This study laid a genetic foundation for improving yield potential in wheat molecular breeding programs.

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