Development and characterization of a novel wheat-rye T2DS2DL-2RL translocation line with high stripe rust resistance

文献类型： 外文期刊

第一作者： Ji, Yuzhou

作者： Ji, Yuzhou;Gong, Wenping;Han, Ran;Wang, Xiaolu;Liu, Aifeng;Li, Haosheng;Liu, Jianjun;Liu, Cheng;Ji, Yuzhou;Bao, Yinguang;Han, Guohao;Li, Jianbo;Ma, Pengtao

作者机构：

关键词： Common wheat; Triticale; Translocation line; Stripe rust; Agronomic performance

期刊名称：PHYTOPATHOLOGY RESEARCH （ 影响因子：3.5； 五年影响因子：3.9 ）

ISSN： 2096-5362

年卷期： 2024 年 6 卷 1 期

页码：

收录情况： SCI

摘要： Rye (Secale cereale L.), a close relative of common wheat, represents a valuable genetic resource for enhancing the disease resistance of common wheat. Introducing novel rye-derived genes into wheat can potentially improve disease resistance. In this study, we successfully developed a novel wheat-rye derivative line LCR4 through hybridization between hexaploid triticale line Currency and common wheat cultivar Jimai 22 (JM22). We confirmed that LCR4 was a T2DS2DL-2RL translocation line via comprehensive molecular cytogenetic analyses, including genomic in situ hybridization, multi-color fluorescence in situ hybridization, molecular marker analysis, and wheat SNP-arrays genotyping. Notably, upon inoculation with Puccinia striiformis f. sp. tritici (Pst) race V26 at the seedling stage and mixed Pst races at the adult stage, LCR4 exhibited robust resistance against stripe rust infection at both stages. Subsequent genetic analysis further elucidated that the translocated 2RL chromosome segment is responsible for this resistance. Consequently, LCR4 harboring elite agronomic traits can be effectively employed in breeding programs against stripe rust.

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