Analyzing Technology Development Trend Based on Patent Data

文献类型: 外文期刊

第一作者: Hao, Xinning

作者: Hao, Xinning;Xie, Nengfu;Sun, Wei

作者机构:

关键词: patent data mining;technology evolution;knowledge transfer;citation analysis

期刊名称:2016 3RD INTERNATIONAL CONFERENCE ON SYSTEMS AND INFORMATICS (ICSAI)

ISSN: 2474-0217

年卷期: 2016 年

页码:

收录情况: SCI

摘要: Patents embody both fundamental researches and technologies, while patent analysis can reflect the technological development trend, grasp the competitive situation of technical subjects effectively, and track technical competitions among countries rapidly. In this paper, a patent data mining method is designed, covering five parts, including the data acquisition, data pre-processing, core dataset construction, network construction and visualization analysis. Besides, technological development trend can be analyzed. Finally, the patent data of soybean breeding techniques is selected for instance analysis.

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