Resistance of Tangmai 4 wheat to powdery mildew, stem rust, leaf rust, and stripe rust and its chromosome composition
文献类型: 外文期刊
第一作者: Li, HJ
作者: Li, HJ;Conner, RL;McCallum, BD;Chen, XM;Su, H;Wen, ZY;Chen, Q;Jia, X
作者机构:
关键词: T1BL center dot 1RS translocation;disease resistance;sequential C-banding and GISH;glutenin;gliadin
期刊名称:CANADIAN JOURNAL OF PLANT SCIENCE ( 影响因子:1.018; 五年影响因子:1.242 )
ISSN: 0008-4220
年卷期: 2004 年 84 卷 4 期
页码:
收录情况: SCI
摘要: The hard red winter wheat Tangmai 4 did not develop symptoms of infection following inoculation with powdery mildew (Erysiphe graminis DC. f. sp. tritici E. Marchal) isolates from regions of western Canada and northern China. Tangmai 4 exhibited resistance to stem rust (Puccinia graminis Pers. f. sp. tritici Eriks. & Henn.) and leaf rust (P. triticina Eriks.) races from western Canada. This wheat line was resistant to individual stripe rust (P. striiformis Westend. f. sp. tritici Eriks.) races from the U.S. and Canada. Sequential C-banding and genomic in situ hybridization (GISH), and electrophoretic analyses of high molecular weight glutenins and gliadins demonstrated that Tangmai 4 carried a pair of TIBL. IRS wheat-rye (Secale cereale L.) translocated chromosomes. Since the genes located on TIBL. IRS are no longer effective in controlling powdery mildew and the rust diseases, Tangmai 4 must carry additional genes for resistance to these diseases, which makes it a valuable resource for the improvement of resistance in wheat against these diseases.
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