QTL mapping of resistance to Gibberella ear rot in maize

文献类型： 外文期刊

第一作者： Wen, Jing

作者： Wen, Jing;Shen, Yanqi;Wang, Ziyu;Han, Siping;Li, Shijie;Yang, Chunming;Hao, Dongyun;Zhang, Yan;Xing, Yuexian

作者机构：

关键词： Gibberella ear rot; Maize; Resistance; QTL mapping

期刊名称：MOLECULAR BREEDING （ 影响因子：2.589； 五年影响因子：2.75 ）

ISSN： 1380-3743

年卷期： 2020 年 40 卷 10 期

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收录情况： SCI

摘要： Gibberella ear rot (GER), caused by the fungal pathogenFusarium graminearum, is becoming one of the most prominent pathogens responsible for ear rot in maize. In this study three F(2)populations, F-2-C, F-2-D, and F-2-J, and their corresponding F(2:3)families, were constructed by crossing three highly GER-resistant inbred lines-Cheng351, Dan598, and JiV203-with the susceptible line ZW18. We used this cross for genetic analysis and QTL mapping of resistance to GER. Analysis of variance of GER in the three F(2)populations revealed the presence of significant differences among genotypes and between locations. The broad-sense heritability (H-2) of GER resistance was estimated to be 0.68, 0.63, and 0.64 in the three F(2)populations, indicating that genetic factors play a key role in the development of phenotypic variation. Seventeen QTLs conferring resistance to GER were detected in the three F(2)populations, among which the QTLqRger7.1, originating from the resistant parent Cheng351, explained 20.16-41.84% of the phenotypic variation. The physical support interval ofqRger7.1exhibited approximately 2 Mb overlap with that ofqRger7.2, which was derived from the resistant parent Dan598, supporting the identification of potential "hotspots" of the target QTLs. QTLs derived from the resistant parents Dan598 and JiV203 accounted for 59.67-61.28% and 65.82-66.90%, respectively, of the phenotypic variation. The GER-resistant QTLs identified in this study are useful candidates for improving the resistance to GER in maize using molecular marker-assisted selection.

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