Wheat germplasm development by gene pyramiding for resistance to race TTKSK of stem rust

文献类型： 外文期刊

第一作者： Jin, Xiaojie

作者： Jin, Xiaojie;Jin, Xiaojie;Chi, Dawn;Wolfe, Danielle;Cao, Wenguang;Xue, Allen;Humphreys, Gavin;Fedak, George;Hiebert, Colin;Fetch, Tom

作者机构：

关键词： Ug99; gene pyramiding; doubled haploids; MAS

期刊名称：CANADIAN JOURNAL OF PLANT SCIENCE （ 影响因子：1.375； 五年影响因子：1.524 ）

ISSN： 0008-4220

年卷期： 2022 年 102 卷 3 期

页码：

收录情况： SCI

摘要： To develop wheat germplasm with resistance to race TTKSK of stem rust, five stem rust resistance genes were used to produce pyramids with up to 4 Sr genes of various combinations by marker-assisted selection (MAS) and doubled haploid (DH) technology. Thirteen desired pyramids with 2 to 4 of the Sr genes were recovered, and wheat cultivar Hoffman was improved by stacking Sr35 and Sr36. TTKSK resistance test showed that pyramided lines with three or four genes plus improved Hoffman with Sr35+Sr36 were all immune to TTKSK. This type of germplasm will be a useful tool for the production of cultivars with long-term sustainability.

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