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The relationship between primary root hair development and net K+ flux in drought resist and drought sensitive wheat

文献类型: 外文期刊

作者: Hou, PeiChen 1 ; Wang, XiaoDong 1 ; Hou, RuiFeng 1 ; Yu, ChunHua 1 ; Sun, Jian 2 ; Lou, XingLiang 2 ; Wei, ZunZheng 3 ; W 1 ;

作者机构: 1.Natl Engn Res Ctr Informat Technol Agr, Beijing 100097, Peoples R China

2.Beijing Forestry Univ, Coll Biol Sci & Technol, Beijing 100083, Peoples R China

3.Beijing Acad Agr & Forestry Sci Beijing, Beijing 100093, Peoples R China

关键词: primary root hair;Scanning ion-selective microelectrode scanning technology(SIET);net K+ flux

期刊名称:ISBE 2011: 2011 INTERNATIONAL CONFERENCE ON BIOMEDICINE AND ENGINEERING, VOL 4

ISSN:

年卷期: 2011 年

页码:

收录情况: SCI

摘要: The relationship between primary root hair development and net K+ flux in drought resist and drought sensitive wheat after being drought is researched in this paper. The Changwu 134(drought resist) and Zhongguochun (drought-sensitive) were treated by 10% PEG 6000.The net K+ ion flux was tested by Scanning ion-selective microelectrode scanning technology(SIET) before and after being treated by PEG 6000.Our results indicate that:(1)The development of primary root hairs of wheat were infected by net K+ ion flux.(2)The number of primary root hairs of drought-resist wheat was more than that of drought-sensitive wheat for strong ability of K+ absorption.

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