文献类型： 会议论文

第一作者： Wenqian Huang

作者： Wenqian Huang ¹ ; Chi Zhang ² ; Baihai Zhang ³ ;

作者机构： 1.School of Automation, Beijing Institute of Technology, Beijing 100081, China, Beijing Research Center of Intelligent Equipment for Agriculture, Beijing Academy of Agriculture and Forestry Sciences, Beijing, 100097, China

2.Beijing Research Center of Intelligent Equipment for Agriculture, Beijing Academy of Agriculture and Forestry Sciences, Beijing, 100097, China

3.School of Automation, Beijing Institute of Technology, Beijing 100081, China

关键词： defect identification;gabor wavelet;SVM;apple quality grading

会议名称： IFIP TC 5/SIG 5.1 conference on computer and computing technologies in agriculture

主办单位：

页码： 343-350

摘要： In this paper, a novel method to recognize defect regions of apples based on Gabor wavelet transformation and SVM using machine vision is proposed. The method starts with background removal and object segmentation by threshold. Texture features are extracted from each segmented object by using Gabor wavelet transform, and these features are introduced to support vector machines (SVM) classifiers. Experimental results exhibit correctly recognized 85% of the defect regions of apples.

分类号： S1`TP3