1IDENTIFICATION OF A SPECIFIC SCAR MARKER FOR DETECTION OF Tilletia foetida (Wall) Liro PATHOGEN OF WHEAT

作者： Liu, D.; Shu, K.; Chen, W. Q.; Liu, T. G.; Gao, L.; Shu, K.; SCI

机构： Sichuan Agr Univ, Dept Plant Pathol, Yaan 625014, Sichuan, Peoples R China; Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing 100193, Peoples R China; Chinese Acad Sci, Inst Genet & Dev Biol, State Key Lab Plant Genom, Beijing 100101, Peoples R China;

来源：RUSSIAN JOURNAL OF GENETICS

2Development of a SCAR marker by inter-simple sequence repeat for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kuhn

作者： Gao, L.; Chen, W. Q.; Liu, T. G.; SCI

机构： CAAS, State Key Lab Biol Plant Dis & Insect Pests, Inst Plant Protect, Beijing 100193, Peoples R China;

来源：FOLIA MICROBIOLOGICA

关键词： detection limit genetic variation

3Development of a sequence-characterized amplified region marker for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kuhn

作者： Gao, L.; Liu, T. G.; Chen, W. Q.; SCI

机构： Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing 100193, Peoples R China;

来源：LETTERS IN APPLIED MICROBIOLOGY

关键词： amplified fragment length polymorphism dwarf bunt of wheat PCR sequence-characterized amplified region Tilletia controversa Kuhn

年份：2009