1Growth, yield and quality of wheat and cotton in relay strip intercropping systems

作者： L.Zhang; L.Zhang; W.van der Werf; SCI

机构： Cotton Research Institute, Chinese Academy of Agricultural Sciences, Key Laboratory for Genetic Improvement of Cotton, Ministry of Agriculture, Anyang, Henan 455004, PR China; Wageningen University, Plant Sciences, Crop and Weed Ecology Group, P.O. Box 430, 6700 AK Wageningen, The Netherlands;

来源：FIELD CROPS RESEARCH

关键词： crop growth analysis grain yield lint yield land equivalence ratio (LER) fiber quality expolinear growth equation competition growth delay

年份：2007