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circuit world(1)

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chemical technology(1)
copper(1)
laminates(1)
metallizing(1)

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作者

Li, Crystal P. L. AND Ciccolo, Paul AND Yee, Dennis K. W.(0)

机构

rohm & haas elect mat asis ltd, dow elect mat, interconnect technol grp, fanling, hong kong, peoples r china(1)
rohm & haas elect mat asis ltd, dow elect mat, interconnect technol, fanling, hong kong, peoples r china(1)
rohm & haas elect mat, dow elect mat, interconnect technol grp, marlborough, ma usa(1)

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资源类型: 外文期刊

作者:Li, Crystal P. L.(精确检索)

作者:Ciccolo, Paul(精确检索)

作者:Yee, Dennis K. W.(精确检索)

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1Inner-layer copper reliability of electroless copper processes

作者： Li, Crystal P. L.; Ciccolo, Paul; Yee, Dennis K. W.; SCI

机构： Rohm & Haas Elect Mat Asis Ltd, Dow Elect Mat, Interconnect Technol Grp, Fanling, Hong Kong, Peoples R China; Rohm & Haas Elect Mat, Dow Elect Mat, Interconnect Technol Grp, Marlborough, MA USA; Rohm & Haas Elect Mat Asis Ltd, Dow Elect Mat, Interconnect Technol, Fanling, Hong Kong, Peoples R China;

来源：CIRCUIT WORLD

关键词： copper laminates metallizing chemical technology