In-situ analysis of nitrogen stress in field-grown wheat: Raman spectroscopy as a non-destructive and rapid method

文献类型： 外文期刊

第一作者： Gao, Zhen

作者： Gao, Zhen;Zhao, Chunjiang;Gao, Zhen;Dong, Daming;Yang, Guiyan;Wen, Xuelin;Bai, Juekun;Cao, Fengjing;Zhao, Chunjiang;Zhao, Xiande;Gao, Zhen;Dong, Daming;Yang, Guiyan;Wen, Xuelin;Bai, Juekun;Cao, Fengjing;Zhao, Xiande;Gao, Zhen

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关键词： Raman spectroscopy; Nitrogen stress; Field-grown wheat; Field rapid analysis

期刊名称：COMPUTERS AND ELECTRONICS IN AGRICULTURE （ 影响因子：8.9； 五年影响因子：9.3 ）

ISSN： 0168-1699

年卷期： 2025 年 237 卷

页码：

收录情况： SCI

摘要： Nitrogen, as a vital element for plant growth and development, significantly influences crop yields. Nitrogen deficiency severely impairs crop growth, while excess nitrogen harms the environment. To address this, there is an urgent need for rapid and on-site methods to assess the physiological status of crops under nitrogen stress. In this study, we utilized Raman spectroscopy, a non-destructive and rapid analytical technique, to evaluate the physiological status of wheat plants subjected to various nitrogen treatments. These treatments included optimal, low, excessive and zero nitrogen application. By leveraging Raman spectroscopy's ability to identify characteristic peaks of metabolites in plant leaves and quantify them based on peak intensity, we analyzed the levels of carotenoids, chlorophylls, cellulose, lignin, and aliphatic components. Our results revealed significant differences in metabolite peak intensity under different nitrogen treatments. Optimal nitrogen application promoted the accumulation of metabolites, while nitrogen deficiency led to a marked decrease in photosynthetic pigments and structural components. Excessive nitrogen caused a reduction in lignin and cellulose. To diagnose nitrogen stress, we developed classification models that accurately distinguished between healthy and nitrogen-stressed plants, achieving a training set accuracy of 99 %, a 5-fold cross-validation accuracy of 92 %, and a prediction set accuracy of 93 %. Furthermore, we differentiated wheat plants with varying degrees of nitrogen deficiency, achieving a maximum accuracy of 78 %. When considering both nitrogen deficiency and excess, the maximum accuracy reached 58 %. This study provides a fast, accurate, and non-destructive analytical method for analyzing and diagnosing nitrogen stress in field wheat based on Raman spectroscopy. Future research aims to extend this approach to the diagnosis of nitrogen stress in other crops and to explore its applications in nitrogen fertilization management.

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