Spatiotemporal Profiling of the Pathogen Complex Causing Common Bean Root Rot in China

文献类型: 外文期刊

第一作者: Yang, Li

作者: Yang, Li;Lu, Xiao-Hong;Li, Shi-Dong;Yang, Li;Wu, Bo-Ming;Zhong, Zeng-Ming

作者机构:

关键词: common bean; root rot; pathogen complex; regional variation; virulence

期刊名称:AGRICULTURE-BASEL ( 影响因子:3.6; 五年影响因子:3.8 )

ISSN:

年卷期: 2025 年 15 卷 13 期

页码:

收录情况: SCI

摘要: Root rot, a globally devastating disease of common bean (Phaseolus vulgaris L.), remains a major constraint on bean production across China. Despite its agricultural impact, the pathogen complex associated with this disease has been poorly characterized in most provinces. To address this critical knowledge gap, we conducted nationwide surveys during 2016-2018, systematically sampling 1-10 symptomatic plants from each of 121 (2016) and 170 (2018) field sites across 17 provinces in China's major vegetable production regions. Isolates obtained from symptomatic root tissues underwent morphological screening, followed by molecular identification using partial sequences of EF1-alpha for Fusarium species and ITS regions for other genera. Pathogenicity of representative isolates was subsequently confirmed through controlled greenhouse assays. This integrated approach revealed fourteen fungal and oomycete genera, with Fusarium (predominantly F. oxysporum and F. solani) and Rhizoctonia (R. solani) emerging as the most prevalent pathogens. Notably, pathogen composition exhibited significant regional variation and underwent temporal shifts across developmental stages. Additionally, F. oxysporum, F. solani, and R. solani demonstrated significant interspecies associations with frequent co-occurrence in bean root rot systems. Collectively, this first comprehensive characterization of China's common bean root rot complex not only clarifies spatial-temporal pathogen dynamics but also provides actionable insights for developing region- and growth stage-specific management strategies, particularly through targeted control of dominant pathogens during key infection windows.

分类号:

  • 相关文献
作者其他论文 更多>>