Development of novel PCR markers linked to the BYDV resistance gene Bdv2 useful in wheat for marker-assisted selection

文献类型： 外文期刊

第一作者： Zhang, ZY

作者： Zhang, ZY;Xu, JS;Xu, QJ;Larkin, P;Xin, ZY

作者机构：

期刊名称：THEORETICAL AND APPLIED GENETICS （ 影响因子：5.699； 五年影响因子：5.565 ）

ISSN： 0040-5752

年卷期： 2004 年 109 卷 2 期

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收录情况： SCI

摘要： The distal segment of the long arm of the Thinopyrum intermedium chromosome 7Ai1 carries the barley yellow dwarf virus (BYDV) resistance gene Bdv2. This segment was transferred to the distal region of the long arm of wheat chromosome 7D in the Yw series of translocation lines by using the ph1b mutant to induce homoeologous pairing. To transfer Bdv2 to commercial varieties, we developed two resistance gene-analog polymorphism (RGAP) markers, Tgp-1(350) and Tgp-2(210), and one randomly amplified polymorphic DNA (RAPD) marker, OPD04(1300). The diagnostic fragments of the RGAP marker Tgp-1(350) and the RAPD marker OPD04(1300) were cloned, sequenced and converted into sequence-characterized amplified region (SCAR) markers, named SC-gp1 and SC-D04, respectively. SC-gp1 and SC-D04 were validated based on available translocation lines and segregating F-2 individuals. Our results indicated that the SCAR markers co-segregated with the BYDV resistance associated with Bdv2. Therefore, they can be used as a low-cost, high-throughput alternative to conventional phenotypic screening in wheat-breeding programs exploiting Bdv2. The marker-assisted selection for BYDV resistance was successfully performed in a wheat-breeding program.

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