Identifying Apple Surface Defects Based on Gabor Features and SVM Using Machine Vision

文献类型： 外文期刊

第一作者： Huang, Wenqian

作者： Huang, Wenqian;Zhang, Baihai;Huang, Wenqian;Zhang, Chi

作者机构：

关键词： defect identification;Gabor wavelet;SVM;apple quality grading

期刊名称：COMPUTER AND COMPUTING TECHNOLOGIES IN AGRICULTURE V, PT III

ISSN： 1868-4238

年卷期： 2012 年 370 卷

页码：

收录情况： SCI

摘要： In this paper, a novel method to recognize defect regions of apples based on Gabor wavelet transformation and SVM using machine vision is proposed. The method starts with background removal and object segmentation by threshold. Texture features are extracted from each segmented object by using Gabor wavelet transform, and these features are introduced to support vector machines (SVM) classifiers. Experimental results exhibit correctly recognized 85% of the defect regions of apples.

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