The relationship between primary root hair development and net K+ flux in drought resist and drought sensitive wheat

文献类型: 外文期刊

第一作者: Hou, PeiChen

作者: Hou, PeiChen;Wang, XiaoDong;Hou, RuiFeng;Yu, ChunHua;Wang, Cheng;Sun, Jian;Lou, XingLiang;Wei, ZunZheng

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关键词: primary root hair;Scanning ion-selective microelectrode scanning technology(SIET);net K+ flux

期刊名称:ISBE 2011: 2011 INTERNATIONAL CONFERENCE ON BIOMEDICINE AND ENGINEERING, VOL 4

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年卷期: 2011 年

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收录情况: SCI

摘要: The relationship between primary root hair development and net K+ flux in drought resist and drought sensitive wheat after being drought is researched in this paper. The Changwu 134(drought resist) and Zhongguochun (drought-sensitive) were treated by 10% PEG 6000.The net K+ ion flux was tested by Scanning ion-selective microelectrode scanning technology(SIET) before and after being treated by PEG 6000.Our results indicate that:(1)The development of primary root hairs of wheat were infected by net K+ ion flux.(2)The number of primary root hairs of drought-resist wheat was more than that of drought-sensitive wheat for strong ability of K+ absorption.

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