文献类型： 外文期刊

作者： Pacholski, Michaeleen L. ¹ ; Qu, Zhaohui ² ; Ouyang, Wuye ² ; Zheng, Zhibo ³ ; Wang, Rong ³ ;

作者机构： 1.Dow Chem Co USA, 400 Arcola Rd, Collegeville, PA 19426 USA

2.Rohm & Haas China Holding Co Ltd, 936 Zhangheng Rd,Zhangjiang Hitech Pk, Shanghai 201203, Peoples R China

3.Peking Univ, Beijing Natl Lab Mol Sci, Coll Chem & Mol Engn, Key Lab Polymer Chem & Phys,Minist Educ, Beijing 100871, Peoples R China

期刊名称：JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B （ 影响因子：1.416； 五年影响因子：1.312 ）

ISSN： 1071-1023

年卷期： 2018 年 36 卷 3 期

页码：

收录情况： SCI

摘要： Depth profiles of thin, latex films using gas cluster ion beam (GCIB) secondary ion mass spectrometry (SIMS) show an oscillation of surfactants and polymer signal that is related to the organization of the particles in the film as layers. These results demonstrate the application of GCIB-SIMS to the distribution of water soluble species with molecular sensitivity, which has implications to film performance in areas of adhesion, appearance, and cohesion. Specifically, surfactant species were found at the highest concentrations at the air interface, decreasing through the top few particle layers to a steady state, whereas salt-rich species (sulfates, oligomers) were found at every particle boundary with a high concentration at the substrate interface. Published by the AVS.