文献类型： 会议论文
第一作者： Philippe Herrmann
作者： Philippe Herrmann 1 ; Sebastien Labbe 2 ; Sebastien Bardin 1 ; Philippe Baufreton 3 ; Nicolas Cornuet 2 ;
作者机构： 1.CEA, LIST
2.EDF Research & Development
3.Sagem - SAFRAN Electronics
关键词： Automatic testing;Symbolic execution;Binary-level analysis
会议名称： International Conference on Quality Software
主办单位：
页码： 11-20
摘要： Dynamic Symbolic Execution (DSE) is a powerful approach to automatic test data generation. It has been heavily used in recent years for finding bugs in desktop programs. In this article, we discuss the use of binary-level DSE for testing safety-critical embedded systems. More especially, we present several innovative features implemented in our DSE tool OSMOSE, and we show through four case-studies how these features can be used in practical situations.
分类号： tp311.5-53
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