1Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

作者： Guan, Wei; Huang, Qi; Shao, Jonathan; Guan, Wei; Zhao, Tingchang; SCI

机构： US Dept Agr, Agr Res Serv, US Natl Arboretum, Floral & Nursery Plants Res Unit, Beltsville, MD 20705 USA; US Dept Agr, Agr Res Serv, North East Area, Beltsville, MD USA; Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing, Peoples R China;

来源：MICROBIOLOGY RESOURCE ANNOUNCEMENTS

年份：2023

2Specific Detection and Identification of American Mulberry-Infecting and Italian Olive-Associated Strains of Xylella fastidiosa by Polymerase Chain Reaction

作者： Zhao, Tingchang; Guan, Wei; Huang, Qi; Shao, Jonathan; Davis, Robert E.; Elbeaino, Toufic; SCI

机构： Chinese Acad Agr Sci, Inst Plant Protect, Beijing 100193, Peoples R China; USDA ARS, Floral & Nursery Plants Res Unit, Beltsville, MD 20705 USA; USDA ARS, Mol Plant Pathol Lab, Beltsville, MD USA; Ist Agron Mediterraneo, Valenzano, BA, Italy;

来源：PLOS ONE

年份：2015

3A TaqMan-based real time PCR assay for specific detection and quantification of Xylella fastidiosa strains causing bacterial leaf scorch in oleander

作者： Huang, Qi; Shao, Jonathan; Davis, Robert E.; Singh, Raghuwinder; Guan, Wei; Zhao, Tingchang; SCI

机构： USDA ARS, Floral & Nursery Plants Res Unit, Beltsville, MD 20705 USA; USDA ARS, Mol Plant Pathol Lab, Beltsville, MD 20705 USA; Louisiana State Univ, Ctr Agr, Dept Plant Pathol & Crop Physiol, Baton Rouge, LA 70803 USA; Chinese Acad Agr Sci, Inst Plant Protect, Beijing 100193, Peoples R China;

来源：JOURNAL OF MICROBIOLOGICAL METHODS

关键词： Xylella fastidiosa Taq Man probes Real-time quantitative PCR Bacterial leaf scorch in oleander

年份：2013