Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

文献类型： 外文期刊

第一作者： Guan, Wei

作者： Guan, Wei;Huang, Qi;Shao, Jonathan;Guan, Wei;Zhao, Tingchang

作者机构：

期刊名称：MICROBIOLOGY RESOURCE ANNOUNCEMENTS （ 影响因子：0.8； 五年影响因子：0.8 ）

ISSN： 2576-098X

年卷期： 2023 年 12 卷 1 期

页码：

收录情况： SCI

摘要： Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%. Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%.

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