Identifying Leaf-Scale Wheat Aphids Using the Near-Ground Hyperspectral Pushbroom Imaging Spectrometer

文献类型： 外文期刊

第一作者： Zhao, Jinling

作者： Zhao, Jinling;Zhang, Dongyan;Luo, Juhua;Wang, Dacheng;Huang, Wenjiang

作者机构：

关键词： Hyperspectral remote sensing;leaf-scale;pushbroom imaging spectrometer (PIS);spectral characteristics;wheat aphids

期刊名称：COMPUTER AND COMPUTING TECHNOLOGIES IN AGRICULTURE V, PT II

ISSN： 1868-4238

年卷期： 2012 年 369 卷

页码：

收录情况： SCI

摘要： This study is to identify leaf-scale wheat aphids using the near-ground hyperspectral Pushbroom Imaging Spectrometer (PIS). Firstly, the spectral characteristics between normal and aphid-infested wheat leaves were compared in spectral reflectance. Concerning the serious aphid damage level, it is obvious that its spectral curve is badly flattened such as green peak (centered around 550 nm), red valley (centered around 680 nm), due to the influence of aphid. Specifically, in the visible spectrum (500-701 nm), the maximum delta (the maximum value minus the minimum value) is 3.3 and it is 7.5 in the near-infrared spectrum (701-900 nm). Then, the spectral difference and change rate were further analyzed. It seems that both curves show the mirror symmetry and their maximum values are 55.8% and 17.4%, respectively. For the difference curve, the value is negative in the visible spectrum (400-700 nm), which shows that the reflectance of normal wheat leaf is less than that of the serious level. Conversely, it is greater in the near-infrared spectrum (700-900 nm). Finally, based on the high spatial resolution PIS image, ENvironment for Visualizing Images (ENVI-EX) was utilized to extract aphids and the overall accuracy reaches 97%. The result indicates that the PIS is sufficient to identify the wheat aphids and this study can lay a foundation for further applications in precision agriculture using such a hyperspectral imaging system.

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