Deletion of a chromosome arm altered wheat resistance to Fusarium head blight and deoxynivalenol accumulation in Chinese Spring
文献类型： 外文期刊
作者： Ma, Hong-Xiang 1 ; Bai, Gui-Hua 2 ; Gill, Bikram S. 2 ; Hart, L. Patrick 2 ;
作者机构： 1.USDA ARS, Plant Sci & Entomol Res Unit, Manhattan, KS 66506 USA
2.USDA ARS, Plant Sci & Entomol Res Unit, Manhattan, KS 66506 USA; Kansas State Univ, Dept Agron, Manhattan, KS 66506 USA; Jiangsu Acad Agr Sci, Nanjing 210014, Peoples R China; Kansas State Univ, Dept Plant Pathol, Manhattan, KS 66506 USA; Michigan State Univ, Dept Plant Pathol, E Lansing, MI 48824 USA
期刊名称：PLANT DISEASE （ 影响因子：4.438； 五年影响因子：4.7 ）
ISSN： 0191-2917
年卷期： 2006 年 90 卷 12 期
页码：
收录情况： SCI
摘要： Fusarium head blight (FHB), caused by Fusarium graminearum Schwabe, is an important disease of wheat worldwide. Production of deoxynivalenol (DON) in infected wheat grain by F graminearum is a major safety concern when considering use of the grain as feed for livestock or for human consumption. Determining chromosome locations of FHB-related genes may facilitate enhancement of wheat resistance to FHB and DON accumulation. In this study, a set of 30 ditelosomic lines derived from Chinese Spring, a moderately FHB-resistant landrace from China. were evaluated for proportion of scabbed spikelets per inoculated spike in the greenhouse and for DON contamination in harvested grain over 2 years. Significant variation in the proportion of scabbed spikelets was observed among ditelosomic lines, ranging from 13 to 95%. Seven ditelosomic lines exhibited a greater proportion of scabbed spikelets and three of these also had greater DON content than Chinese Spring (P = 0.01), suggesting that those missing chromosome arms may carry genes that contribute to resistance to FHB. Six ditelosomic lines had a reduction in proportion of scabbed spikelets, suggesting that susceptibility factors or resistance suppressors may be on these missing chromosomal arms. Selection for low proportion of scabbed spikelets in general will select for low DON content.
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