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Identification of genes involved in stem rust resistance from wheat mutant D51 with the cDNA-AFLP technique

文献类型: 外文期刊

作者: Yin, Jing 1 ; Wang, Guangjin 3 ; Xiao, Jialei 2 ; Ma, Fengming 4 ; Zhang, Hongji 2 ; Sun, Yan 2 ; Diao, Yanling 2 ; Huang 1 ;

作者机构: 1.NE Forestry Univ, Coll Life Sci, Harbin 150040, Peoples R China

2.Heilongjiang Acad Agr Sci, Inst Crop Breeding, Harbin 150086, Peoples R China

3.Heilongjiang Acad Agr Sci, Biotechnol Res Ctr, Harbin 150086, Peoples R China

4.NE Agr Univ, Harbin 150030, Heilongjiang, Peoples R China

关键词: environment stress;defense response

期刊名称:MOLECULAR BIOLOGY REPORTS ( 影响因子:2.316; 五年影响因子:2.357 )

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收录情况: SCI

摘要: Wheat (Triticum aestivum L.) stem rust caused by Puccinia graminis f. sp. tritici is one of the main diseases of wheat worldwide. Wheat mutant line D51, which was derived from the highly susceptible cultivar L6239, shows resistance to the prevailing races 21C3CPH, 21C3CKH, and 21C3CTR of P. graminis f. sp. tritici in China. In this study, we used the cDNA-AFLP technology to identify the genes that are likely involved in the stem rust resistance. EcoRI/MseI selective primers were used to generate approximately 1920 DNA fragments. Seventy five differentially transcribed fragments (3.91%) were identified by comparing the samples of 21C3CPH infected D51 with infected L6239 or uninfected D51. Eleven amplified cDNA fragments were sequenced. Eight showed significant similarity to known genes, including TaLr1 (leaf rust resistance gene), wlm24 (wheat powdery mildew resistance gene), stress response genes and ESTs of environment stress of tall fescue. These identified genes are involved in plant defense response and stem rust resistance and need further research to determine their usefulness in breeding new resistance cultivars.

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